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As part of Flip Chip and Driver IC turnkey solutions (bumping, wafer sort, back-end assembly and test), Siliconware provides robust, reliable, and cost-effective bumping services.
Siliconware licensed its solder bumping technology from industry leaders K&S (Flip Chip Division, USA) for printing bump and ball placement. Through continuing technology development, Siliconware is a leading company in 200mm and 300mm bumping technologies for larger die size (>23X23mm), dielectric materials (BCB, PI & PBO) and multiple solder types (Sn63/Pb37, and Sn/Ag/Cu, Sn/Ag, Cu).

SERVICE

‧ 8”/12” Solder bump (FOC/REPSV/RDL)
‧ 8”/12” Ball Placement (REPSV/RDL)

APPLICATIONS
  Solder Bump/Ball
Application ‧ Graphic
‧ Chipset
‧ Wireless
‧ FPGA
‧ Memory
‧ ASIC
PROCESS CAPABILITY
  Solder Bump Ball Placement Cu pillar Bump
Wafer size 12 inch / 8 inch 12 inch / 8 inch 12 inch / 8 inch
Process 1. FOC
2. REPSV
3. RDL
1. REPSV
2. RDL
1. FOC
2. REPSV
Min. bump pitch Array: 150um
Peripheral: 100um
Array: 400um Array: 80um
Peripheral: 60um
Bump material 1. Sn63/Pb37
2. Sn/Ag2.3
3. SnCu
4. SnAgCu
5. Cu Pillar
SnAgCu Sn/Ag1.8
RDL trace Ti/Cu/Cu
Ti/Al/Ti
Ti/Cu/Cu
Ti/Al/Ti
 
QUALITY SPECIFICATION
 Solder bump/ball quality spec
Item Criteria
Bump/Ball height Target ± 15 um
Coplanarity < 30 um
Bump/Ball shear force Eutectic Bump : >2.0 g/mil2
Pb-free Bump : >2.5 g/mil2
Visual inspection Foreign materials, Large bumps, Missing bumps... etc.
Void inspection Printed bump: - Bump Void < 30% of the bump diameter
Plated bump: - Bump Void < 10% of the bump diameter
 
 
WAFER LEVEL RELIABILITY
 Solder Bump
Test Test condition Duration Sample size Criteria
High Temperature Storage Test 150°C 500/1000 Hrs 45 Bump/ 1ot Shear interface must be on solder
Temperature Cycling Test -55~150°C 500/1000 Cycle 45 Bump/ 1ot Shear interface must be on solder
High Accelerated Stress Test 130°C/85%RH/33.3 Psia 96 Hrs 45 Bump/ 1ot Shear interface must be on solder
Multi-Reflow 260°C 3/5/10 x 45 Bump/ 1ot Shear interface must be on solder
BOARD LEVEL RELIABILITY
Test Test condition Sample size Criteria
Temperature Cycling Test -40 ~ 125°C 32 units 1st fail > 500 Cycles
Drop Test 1500G/0.5ms 60 units 1st fail > 30 drops
 
 
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